ALGORITHM FOR DETERMINING PHOTORESIST CHARACTERISTICS

Authors

  • Georgi Dobrev Technical University of Sofia, Plovdiv Branch (BG)
  • Nikolay Paunkov Technical University of Sofia, Plovdiv Branch (BG)
  • Radoslava Terzieva Technical University of Sofia, Plovdiv Branch (BG)
  • Misho Matsankov Technical University of Sofia, Plovdiv Branch (BG)
  • Iva Naydenova Technical University of Sofia, Plovdiv Branch (BG)
  • Dilyana Budakova Technical University of Sofia, Plovdiv Branch (BG)

DOI:

https://doi.org/10.17770/etr2024vol2.8073

Keywords:

photoresistor, photocurrent, the intrinsic photoeffect

Abstract

This paper presents data from a photoresist stady. Computational models have been developed to determine basic physical characteristics. A software algorithm for their derivation has been developed. Models for the calculation of basic characteristics such as integral sensitivity, efficiency, photoresist activation energy are presented. A number of statistical and mathematical analyses are presented.

 

Supporting Agencies
The autors acknowledge the suport of Technical University of Sofia.

Downloads

Download data is not yet available.

References

A. Chip,A. Ahmed ,S. Arya., Semiconductor Photoresistors, Optical Properties and Applications of Semiconductors, DOI: 10.1201/9781003188582-6, ,2023

S.Zhu,S. Zhao,L. Chan,Q. Fang, The European Physical Journal Plus138(11)DOI: 10.1140/epjp/s13360-023-04660-4,2023

M. Aburas,A. Esper,P. Bernaudin,A. Drouart F. Esnault.A. G. Ghribi,H. Savaujs,M. Stodel, IEEE Transactions on Applied Superconductivity PP(99):1-4,DOI: 10.1109/TASC.2024.3356434,2023

L.Yue,Z. Mao,Q. Wu,Y. Li,Y. Li,Physical model-based ArF photoresist formulation development, AIP Advances 14(2),DOI: 10.1063/5.0186648

P. Lochner,J. Kerski,A. Kurzmann,A. Wieck,A. Ludwig,A. Lorke, Internal photoeffect from a single quantum emitter,DOI: 10.1103/PhysRevB.103.075426,2021

J. Lee,P. Asenov,R. Phyner,E. Kao,S. Amoroso,A.Brown,X. Lin,V. Moroz, IEEE Transactions on Electron Devices PP(99):1-7, DOI: 10.1109/TED.2024.3357615,2024

V. Bakarzhiev, S.Sabev,K. Chukalov,P. Kasabov”Research into the accuracy of holes in 3D printing using taguchi method environment technologies resources, proceedings of the international scientific and practical conference “,3.36-40 DOI :10.17770/ETR2023VOL.7254.,2023

V. Bakarzhiev, S.Sabev, P. Kasabov, K. Chukalov”Research into 3D printing layer adhesion in abs materials,environment ,technologies,resources ,proceedings of the international scientific and practical conference,”3.41-45.DOI :10.17770/ETR2023VOL3.7255,2023.,2023

A.Abraham,B.Dai, Correlation and Regression Analyses, Research Methods in the Dance Sciences, DOI: 10.5744/florida/9780813069548.003.0014,2023

R.Hirsh,Regression analyses, DOI: 10.1007/978-3-031-41914-0_9,2023

V. Chukwunenye,C. Onyenekwe,A.Abidemi, echnological and Scientific Advancement in Developing Countries: The Role of Physical SciencesAt: Nnamdi Azikiwe University, Awka,2023

A.Nirmal,D.Jauaswai,P.Kachare, Statistically Significant Duration-Independent-based Noise-Robust Speaker Verification,International Journal of Mathematical Engineering and Management Sciences, DOI: 10.33889/IJMEMS.2024.9.1.008,2024

H.Huang, 3D Animation Simulation Based on Computer Virtual Simulation Technology, DOI: 10.1007/978-981-99-7011-7_18,2024

R.Yudira,V.Morales,S.Cisneros,J.Perez,F.Sandoval,R.Carrilio,S.Perez,S.Ibarra,t.Sander,O.Cisneros,O.Perez, 3D Simulation-Based Acoustic Wave Resonator Analysis and Validation Using Novel Finite Element Method Software, Sensors Update 21(8):1-18, DOI: 10.3390/s21082715,2021

J. Ye,A.Loi,A.Lai,G.Betta, Journal of Instrumentation DOI: 10.1088/1748-0221/18/11/C11021,2023

Downloads

Published

2024-06-22

How to Cite

[1]
G. Dobrev, N. Paunkov, R. Terzieva, M. Matsankov, I. Naydenova, and D. Budakova, “ALGORITHM FOR DETERMINING PHOTORESIST CHARACTERISTICS”, ETR, vol. 2, pp. 364–370, Jun. 2024, doi: 10.17770/etr2024vol2.8073.